Apertureless scanning near field optical microscope with sub-10nm resolution
نویسندگان
چکیده
منابع مشابه
Apertureless near-field optical microscope
We demonstrate a new method whereby near-field optical microscope resolution can be extended to the nanometer regime. The technique is based on measuring the modulation of the scattered electric field from the end of a sharp silicon tip as it is stabilized and scanned in close proximity to a sample surface. Our initial results demonstrate resolution in the 3 nm range--comparable to what can be ...
متن کاملScanning Head for the Apertureless near Field Optical Microscope
The design and characterization of a tip control unit for an apertureless scanning near field optical microscope (ASNOM) is reported. To make the instrument operation easier, the cantilever control parts (piezo excitation of the cantilever vibration for the dynamic mode feedback and the parts necessary for the optical lever scheme of the vibration control) were placed in a separate detachable a...
متن کاملCharacterization of ion exchanged integrated lightwave devices with an apertureless scanning near-field optical microscope
Sébastien Aubert*, Elise Ghibaudo, Aurélien Bruyant*, Sylvain Blaize*, Renaud Bachelot*, Gilles Lerondel*, Pascal Royer*, Jean-Emmanuel Broquin [email protected] Laboratoire de Nanotechnologie et d’Instrumentation Optique, Université de Technologie de Troyes, 12 rue Marie Curie, BP2060, 10010 Troyes cedex, France Institut de Microélectronique, Electromagnétisme et Photonique, LEMO-ENSERG, UMR 5530,...
متن کاملField enhancement in apertureless near-field scanning optical microscopy.
The near field of an apertureless near-field scanning optical microscopy probe is investigated with a multiple-multipole technique to obtain optical fields in the vicinity of a silicon probe tip and a glass substrate. The results demonstrate that electric field enhancements of >15 relative to the incident fields can be achieved near a silicon tip, implying intensity enhancements of several orde...
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ژورنال
عنوان ژورنال: Review of Scientific Instruments
سال: 2006
ISSN: 0034-6748,1089-7623
DOI: 10.1063/1.2190211